Thermal measuring and testing – Temperature measurement – By a vibratory effect
Patent
1994-06-30
1997-03-04
Gutierrez, Diego F. F.
Thermal measuring and testing
Temperature measurement
By a vibratory effect
310361, 310370, G01K 1122
Patent
active
056072368
ABSTRACT:
A quartz oscillator temperature sensor which measures temperature based on the change in resonance or oscillation frequency of a quartz oscillator with the change in temperature the oscillator can be constructed by cutting a piece of quartz from a wafer with a thickness of about 80 to 150 .mu.m by rotating the plane of the crystal defined by the electrical and mechanical axes 15.degree. to 25.degree. about the electrical axis and then forming the wafer into a quartz tuning fork. The tuning fork is housed in a case sealed with a stem and coupled to electrical leads with heat resistent solder formed with more than about 90 wt % Pb and less than 10% Sn. The area within the case should be at a substantially high vacuum.
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The Application of Piezoelectricity to Watches, by Eishi Momosaki et al., Ferroelectrics, 1982, vol. 40, pp. 203-216.
Nagai Mitsuru
Takagi Michiaki
Gutierrez Diego F. F.
Seiko Epson Corporation
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