Quartz oscillator measuring head

Coating apparatus – With indicating – testing – inspecting – or measuring means

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Details

118664, 118665, 118715, 427 10, 324 71R, B05C 1100

Patent

active

043621252

ABSTRACT:
An oscillator crystal measuring head is disclosed, for vacuum coating apparatus, intended for measuring the mass of substance which is deposited on an oscillator crystal during a deposition of thin layers, and by which the frequency of the crystal is changed. To obtain a longer, continuous measuring period, the measuring head is designed with a crystal changer in the form of a rotary support and to ensure that always identical surface areas of each crystal are coated, further apertured screens are provided in addition to an apertured screen which is fixed to the housing. These further screens are moved along with the individual crystals and can be pressed, in their measuring position, into heat conducting contact with the fixed screen. The movable screens may be designed as a single rotary screen plate which can be pressed against the fixed screen by a spring.

REFERENCES:
patent: 3383238 (1968-05-01), Unzicker et al.
patent: 3667424 (1972-06-01), Cornelius et al.
patent: 4207836 (1980-06-01), Nonaka
King et al., "Observations on a Quartz/Crystal Deposition Monitor", Journal of Physics E: Scientific Instruments, 1971, vol. 4, No. 12, (Dec. 1971).

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