Quantum well intermixing

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Ordered or disordered

Reexamination Certificate

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C438S037000, C438S046000, C430S321000

Reexamination Certificate

active

06617188

ABSTRACT:

BACKGROUND TO THE INVENTION
The monolithic integration of several optoelectronics devices in optoelectronics integrated circuits (OEICs) and photonic integrated circuits (PICs) is of considerable interest for the development of telecommunications systems.
In OEICs, optical devices such as lasers and electronic devices such as transistors are integrated on a single chip for high speed operation since parasitic reactance in the electrical connections can be minimized from the closely packed devices.
PICs are a subset of OEICs with no electrical components, in which only photons are involved in the communication or connection between optoelectronics and/or photonic devices. The driving forces for PICs are to improve the complexity of next-generation optical communication links, networking architectures and switching systems, such as in multiple channel wavelength division multiplexing (WDM) and high speed time division multiplexing (TDM) systems. In PICs, besides gaining from the low cost, size reduction, and increased packaging robustness, the main advantage is that all the interconnections between the individual guided-wave optoelectronics devices are precisely and permanently aligned with respect to one another since the waveguides are lithographically produced.
In the integration process, complex devices are built up from components that are very different in functionality such as light emitters, waveguides, modulators and detectors. Each component needs different material structures to achieve optimized performance. As a result, the ability to modify the bandgap energy and the refractive index of materials is important in order to realize OEICs and PICs. A number of techniques have emerged for this purpose, including growth and regrowth, selective area epitaxy or growth on a patterned substrate and quantum well intermixing (QWI).
Growth and regrowth is a complicated and expensive technique which involves growing, etching and regrowing of quantum well (QW) layers at selected areas on bulk material. These layer structures are overgrown with the same upper cladding but a different active region. This approach suffers from mismatches in the optical propagation coefficient and mismatches in the dimensions of the waveguide at the regrown interface. In addition, this process gives low yield and low throughput, and therefore adds cost to the final product.
Selective area growth utilizes differences in epitaxial layer composition and thickness produced by growth through a mask to achieve spatially selective bandgap variation. Prior to epitaxy growth, the substrate is patterned with a dielectric mask such as SiO
2
, in which slots with different widths are defined. The growth rate in the open areas depends on the width of the opening and the patterning of the mask. No growth can take place on top of the dielectric cap. However, surface migration of the species can take place for some distance across the mask to the nearest opening. The advantage of this approach is a reduction in the total number of processing steps such that essentially optimum laser and modulator multiple quantum well (MQW) sections can be accomplished in a single epitaxial growth stage. This process works well under a precisely controlled set of parameters but is difficult to manipulate in a generic fashion. In addition, this technique gives poor spatial resolution of around 100 &mgr;m, and hence the passive section generally has a relatively high loss.
QWI is based on the fact that a QW is an inherently metastable system due to the large concentration gradient of atomic species across the QWs and barriers interface. Hence, this allows the modification of the bandgap of QW structures in selected regions by intermixing the QWs with the barriers to form alloy semiconductors. This technique offers an effective post-growth method for the lateral integration of different bandgaps, refractive index and optical absorption within the same epitaxial layers.
The QWI technique has been gaining recognition and popularity for which several potential applications in integrated optoelectronics have been identified, for example bandgap-tuned electroabsorption modulators, bandgap-tuned lasers, low-loss waveguides for interconnecting components on an OEIC or PIC, integrated extended cavities for line-narrowed lasers, single-frequency distributed Bragg reflector (DBR) lasers, mode-locked lasers, non-absorbing mirrors, gain or phase gratings for distributed feedback (DFB) lasers, superluminescent diodes, polarization insensitive QW modulators and amplifiers, and multiple wavelength lasers.
Current research has been focused on QWI using approaches such as impurity free vacancy induced disordering (IFVD), laser induced disordering (LID) and impurity induced disordering (IID). Each of these QWI techniques has its advantages and shortcomings.
The IFVD method involves the deposition of a dielectric capping material on the QW materials and subsequent high temperature annealing to promote the generation of vacancies from the dielectric cap to the QW materials and hence enhance the intermixing at selected areas. For instance, in GaAs-AlGaAs QW materials, SiO
2
is known to induce out-diffusion of Ga atoms during annealing, hence generating group III vacancies in the QW material. The thermal stress at the interface between the GaAs and the SiO
2
layer plays an important role. The thermal expansion coefficient of GaAs is ten times larger than that of SiO
2
. During high temperature annealing, the bonding in the highly porous SiO
2
layer deposited using plasma-enhanced chemical vapor deposition (PECVD) may be broken due to the stress gradient between the GaAs and SiO
2
film. Thus, the out-diffusion of Ga helps to relieve the tensile stress in the GaAs. These Ga vacancies then propagate down to the QW and enhance the interdiffusion rate of Ga and Al, and hence result in QWI. After the intermixing process, the bandgap in the QW material widens and the refractive index decreases.
The selectivity of this technique can be obtained using an SrF
2
layer to inhibit the outdiffusion of Ga, hence suppress the QWI process. Using this technique, devices such as multiple wavelength bandgap tuned lasers and multiple channel waveguide photodetectors have been successfully demonstrated.
Although IFVD is a successful technique when employed in GaAs/AlGaAs system, this technique gives poor reproducibility in InGaAs/InGaAsP systems. Furthermore, due to the poor thermal stability of InGaAs/InGaAsP materials, the IFVD process, which requires high temperature annealing, is found to give low bandgap selectivity in InGaAs/InGaAsP based QW structures.
Laser induced disordering (LID) is a promising QWI process to achieve disordering in InGaAs/InGaAsP QW materials due to the poor thermal stability of the materials. In the photoabsorption-induced disordering (PAID) method, a continuous wave (CW) laser irradiation is absorbed in the QW regions, thereby generating heat and causing thermal induced intermixing. Although the resulting material is of high optical and electrical quality, the spatial selectivity of this technique is limited by lateral flow to around 100 &mgr;m. A modification of the PAID method, known as pulsed-PAID (P-PAID), uses high-energy Q-switched Nd:YAG laser pulses to irradiate the InP-based material. Absorption of the pulses results in disruption to the lattice and an increase in the density of point defects. These point defects subsequently interdiffuse into the QW during high temperature annealing and hence enhance the QW intermixing rate. Though P-PAID can provide spatial resolution higher than 1.25 &mgr;m and direct writing capability, the intermixed materials give low quality due to the formation of extended defects.
Of all the QWI methods, impurity induced disordering (IID) is the only process which requires the introduction of impurities into the QW materials in order to realize the intermixing process. These impurities can be introduced through focused ion beam, furnace-based impurity diffusion and also ion implantation.
IID is a relatively s

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