Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2005-04-19
2005-04-19
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
06882431
ABSTRACT:
The disclosed Quantum Optical Coherence Tomography apparatus and method includes a source of quantum entangled photons and a quantum interference device. The pair of entangled photons is divided into two beams, one of which illuminates a semi-reflective object and the second of which is reflected from a variable optical time-delay element (VTE). The VTE is scanned and the quantum interference in the QID is recorded to build up a reflectance profile of the object. A real scanning produces a full tomographic reflectance image. A method of processing the data to eliminate the effects of optical dispersion is disclosed.
REFERENCES:
patent: 6744518 (2004-06-01), Dress et al.
patent: 6762844 (2004-07-01), Dress et al.
Abouraddy Ayman F.
Nasr Magued B.
Saleh Bahaa E A.
Sergienko Alexander V.
Teich Malvin C.
Connolly Patrick
Toatley , Jr. Gregory J.
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