Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2007-02-27
2007-02-27
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C422S051000, C422S051000, C424S499000, C137S833000, C210S198200
Reexamination Certificate
active
10560311
ABSTRACT:
The present invention provides a quantitative measurement method and quantitative measurement chip which can perform quantitative measurement of a target substance in a short period of time. The invention provides a quantitative measurement method in which a three dimensional mesh structure material is formed, and quantitative measurements are taken of the target substance using a structure which contains a reagent that reacts with the target substance in the mesh. This method includes a contacting step in which a test specimen which includes the target substance is brought into contact with the structure; a detecting step which, in a process in which a substance whose quantity will increase or decrease by means of the reaction between the target substance and the reagent, detects the substance whose quantity is increasing or decreasing within the structure at a contact interface between the test specimen and the reagent; and a quantitative measurement step which performs quantitative measurement of the target substance based on the results of the detecting step. The mesh structure will allow at least the target substance to pass therethrough.
REFERENCES:
patent: 4061466 (1977-12-01), Sjoholm et al.
patent: 4379775 (1983-04-01), Brandstetr et al.
patent: 4486537 (1984-12-01), Koyama et al.
patent: 4820490 (1989-04-01), Morris
patent: 5840340 (1998-11-01), Milstein et al.
patent: 6352578 (2002-03-01), Sakata et al.
patent: 6413550 (2002-07-01), Milstein et al.
patent: 6657614 (2003-12-01), Ito et al.
patent: 7033603 (2006-04-01), Nelson et al.
patent: 2004/0028655 (2004-02-01), Nelson et al.
patent: 2004/0121420 (2004-06-01), Smith
patent: 2005/0213868 (2005-09-01), Cunningham
patent: 2006/0091051 (2006-05-01), Takada et al.
patent: 2006/0193769 (2006-08-01), Nelson et al.
patent: H08-122320 (1996-05-01), None
patent: 2003-057225 (2003-02-01), None
Shimasaki Takaaki
Yokogawa Akinori
Rohm Co. Ltd
Shinjyu Global IP
Tsai Carol S. W.
LandOfFree
Quantitative measurement method and quantitative measurement... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Quantitative measurement method and quantitative measurement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quantitative measurement method and quantitative measurement... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3871616