Quantitative light microscope using a solid state detector in th

Details Quantitative light microscope using a solid state detector in th Quantitative light microscope using a solid state detector in th

1987-08-20

1989-07-04

Groody, James J.

Facsimile and static presentation processing

Static presentation processing

Attribute control

358107, 382 6, 36441301, H04N 718

Patent

active

048455520

ABSTRACT:
A solid state microscope for viewing and scanning microscopic objects. The solid state microscope has a light source with a condensor and diffusion filter. A moveable stage is provided to allow X, Y, Z plane displacements in order to scan objects under the microscope. There is an objective to magnify the image of the object and project this image onto a two dimensional solid state image sensor. The solid state image sensor sends signals to an analog-to-digital converter where the signals are digitized and sent to a frame memory. A monitor is used to display the image of the object as stored in frame memory. The present invention can be interfaced with a computer to allow for automatic focusing and scanning of an image. The computer also houses storage means to store images. Methods of scanning an object are also described. A prism element can be used to obtain spectral scans of an object. In another scanning method, a first edge row of pixels is used to detect an object of interest in the scanned image. This first detection row activates an area of the sensor array at a later time to capture the entire image. In this way, only relevant information is collected and processed.

REFERENCES:
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patent: 4617682 (1986-10-01), Mori et al.
patent: 4633504 (1986-12-01), Wihl
patent: 4661986 (1987-04-01), Adelson
patent: 4672559 (1987-06-01), Jansson et al.
patent: 4680635 (1987-07-01), Khurana
patent: 4731745 (1988-03-01), Katagiri et al.

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