Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1990-08-31
1994-11-08
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324642, 324644, 73602, 73620, 1286532, 364481, G01N 2900
Patent
active
053630505
ABSTRACT:
In a microwave imaging system, a three dimensional profile of the dielectric permittivity of a target is obtained. A transmitter transmits microwaves toward a target, and the target scatters the microwaves. The scattered waves are received by an antenna and are converted into suitable data for application to a digital computer. The computer processes the data using either a scattering matrix algorithm or a Fourier transform algorithm. The computer then generates data representative of a three dimensional profile of dielectric permittivity which can be displayed on a suitable display device such as a CRT.
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Guo Theodore C.
Guo Wendy W.
Brown Glenn W.
Wieder Kenneth A.
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