Quantitative calorimetry signal for sub-micron scale thermal...

Details Quantitative calorimetry signal for sub-micron scale thermal... Quantitative calorimetry signal for sub-micron scale thermal...

2007-05-08

2010-02-23

Allen, Andre J (Department: 2855)

Thermal measuring and testing

Calorimetry

Reexamination Certificate

active

07665889

ABSTRACT:
The invention is a system and method for producing highly localized calorimetry data on a sample surface. The system is based on an SPM or other system with a probe and fine positioning capability. A heated probe is used to take a small sample (nano-sample) of a surface, and thereby make calorimetry measurements in a controlled manner.

REFERENCES:
patent: 2006/0254345 (2006-11-01), King et al.

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