Quantifying circuit performance

Details Quantifying circuit performance Quantifying circuit performance

1996-10-29

1999-03-02

Shah, Kamanini

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

702 97, G06F 1100

Patent

active

058783830

ABSTRACT:
The invention relates to automated testing of equipment items of the electronic, electrical, and optical type over a range of environmental conditions. A testing apparatus operates to vary an operating environment of an item of test equipment between a lower extreme and an upper extreme, and iteratively searches each test parameter for a peak response. The peak response is compared with a response limit specified in a customer specification or an international standard. The apparatus assesses a design robustness of the equipment item by comparing a set of measured responses with a maximum range of responses specified in the customer specification or international standard. The apparatus produces a data output for each performance parameter tested, identifying performance parameters which are outside the customer specification, or which have insufficient design robustness.

REFERENCES:
patent: 5583875 (1996-12-01), Weiss
patent: 5600576 (1997-02-01), Broadwater et al.

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