Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Reexamination Certificate
2005-08-23
2005-08-23
Patidar, Jay (Department: 2862)
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
C324S225000, C324S238000, C324S240000, C702S038000, C702S105000
Reexamination Certificate
active
06933718
ABSTRACT:
The present invention provides a method for the direct measurement and quantification of the material volume loss on and beneath a first surface of a substrate and thus provides an accurate depiction of the profile of the substrate. The method of the invention comprises inducing multiple eddy currents in a test substrate to determine volume loss.
REFERENCES:
patent: 2572908 (1951-10-01), Brenholdt
patent: 3340466 (1967-09-01), Ono
patent: 3450986 (1969-06-01), Chapman et al.
patent: 3764897 (1973-10-01), Greenwood
patent: 3968681 (1976-07-01), Cornforth et al.
patent: 4146837 (1979-03-01), Bashkirov
patent: 4271393 (1981-06-01), Hansen et al.
patent: 4292588 (1981-09-01), Smith
patent: 4503392 (1985-03-01), Fastritsky et al.
patent: 4652822 (1987-03-01), Wallace
patent: 4652823 (1987-03-01), Sutton
patent: 4727322 (1988-02-01), Lonchampt et al.
patent: 4755753 (1988-07-01), Chern
patent: 4757259 (1988-07-01), Charpentier
patent: 4843319 (1989-06-01), Lara
patent: 4843320 (1989-06-01), Spies
patent: 4954778 (1990-09-01), Champonnois et al.
patent: 5028100 (1991-07-01), Valleau et al.
patent: 5059903 (1991-10-01), Otaka et al.
patent: 5180969 (1993-01-01), Kwun et al.
patent: 5182513 (1993-01-01), Young et al.
patent: 5237271 (1993-08-01), Hedengren
patent: 5311128 (1994-05-01), Lareau et al.
patent: 5371462 (1994-12-01), Hedengren et al.
patent: 5485082 (1996-01-01), Wisspeintner et al.
patent: 5491409 (1996-02-01), Flora et al.
patent: 5510709 (1996-04-01), Hurley et al.
patent: 5602474 (1997-02-01), Morrey, Jr.
patent: 5610517 (1997-03-01), Ma et al.
patent: 5648721 (1997-07-01), Wincheski et al.
patent: 6037768 (2000-03-01), Moulder et al.
patent: 6285183 (2001-09-01), Collingwood et al.
patent: 6504363 (2003-01-01), Dogaru et al.
patent: 6545469 (2003-04-01), Batzinger et al.
patent: 0 332 048 (1989-09-01), None
patent: 2 090 2977 (1982-07-01), None
patent: 789730 (1980-12-01), None
patent: 832442 (1981-05-01), None
Collingwood Michael R.
Keener Steven G.
Alston & Bird LLP
Kinder Darrell
Patidar Jay
The Boeing Company
LandOfFree
Quantification method and system for corrosion and damage... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Quantification method and system for corrosion and damage..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quantification method and system for corrosion and damage... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3513691