Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2007-12-04
2007-12-04
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
Reexamination Certificate
active
11311639
ABSTRACT:
A quality variation display device that can surely identify periodic information about quality on a product number basis such as the occurrence of a failure for every prescribed number of products is provided. The device includes a quality data storing database that stores the measurement result of each product measured by a measuring unit in association with the manufacturing order, an interval statistic calculation portion that shifts an interval corresponding to a prescribed number of products by a prescribed shift number of products, obtains a statistic for each of the intervals, and produces a graph representing the statistics in the manufacturing order at equal intervals, and a display portion that displays the graph.
REFERENCES:
patent: 6622101 (2003-09-01), Oechsner et al.
patent: 6801822 (2004-10-01), Fujiwara et al.
patent: 2003-295925 (2003-10-01), None
Fujii Toru
Sugihara Shiro
Foley & Lardner LLP
Khuu Cindy D.
Nghiem Michael P.
Omron Corporation
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