Quality monitoring method and apparatus for wavelength...

Optical communications – Diagnostic testing – Determination of communication parameter

Reexamination Certificate

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C398S157000

Reexamination Certificate

active

10806330

ABSTRACT:
The present invention has an object to provide a technology for monitoring the quality of a WDM signal light, capable of quickly and accurately judging an occurrence of quality deterioration of signal light and a deterioration factor thereof. To this end, according to a quality monitoring apparatus of WDM signal light of the present invention, a part of the WDM signal light being propagated through an optical transmission path is branched as a monitor light, a signal light of one wavelength contained in the monitor light is selected as a channel to be measured. Then, the frequency of occurrences of bit error for the channel to be measured is repeatedly measured for a plurality of times, and whether or not the signal quality is deteriorated is judged, together with the deterioration factor based on the measurement results, and a control signal light for adjusting the signal light power according to the judgment result is transmitted to the optical transmission path, to achieve the improvement of a characteristic of the WDM signal light.

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A. Agata et al., “Bit error characteristics for various degradation factors in optical transmission systems” in Proceedings of 2002 Communication Society Conference of the Institute of Electronics, Information and Communication Engineers (IEICE)/ vol. 2, Japan, Aug. 20, 2002, B-10-77, p. 365.
Japanese Patent Office Action, mailed Oct. 2, 2007 and issued in corresponding Japanese Patent Application No. 2003-081779.

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