Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2005-04-28
2008-01-29
Picard, Leo (Department: 2125)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C702S084000, C702S182000
Reexamination Certificate
active
07324862
ABSTRACT:
Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a data storing part which collects measurement data measured by multiple devices disposed in a manufacturing process and stores the collected measurement data along with measured time or collected time; and a scheduler which associates the measurement data of the devices with each other in consideration of dead time generated between the devices at measured time or collected time.
REFERENCES:
patent: 5706213 (1998-01-01), Takakura et al.
patent: 6574522 (2003-06-01), Douglas
patent: 2002/0077761 (2002-06-01), Haraburda et al.
patent: 2004/0225396 (2004-11-01), Maeritz
patent: 2005/0065752 (2005-03-01), Shafer et al.
patent: 2005/0251278 (2005-11-01), Popp
patent: 63-120060 (1988-05-01), None
patent: 03-228531 (1991-10-01), None
patent: 4-188301 (1992-07-01), None
patent: 6-110504 (1994-04-01), None
patent: 7-141005 (1995-06-01), None
patent: 09-160982 (1997-06-01), None
patent: 2000-091178 (2000-03-01), None
patent: 2000-094271 (2000-04-01), None
patent: 2000-334641 (2000-12-01), None
patent: 2003-241819 (2003-08-01), None
patent: WO 02/29733 (2002-04-01), None
G. Taguchi et al., Hinshitsu Kogaku Koza 1/Kaihatsu-Sekki Dankai no Hinshitsu Kogaku, Nihon Kikaku Kyokai, 1998, pp. 28-65.
Fujii Toru
Sono Mineo
Sugihara Shiro
Foley & Lardner LLP
Omron Corporation
Picard Leo
Rao Sheela
LandOfFree
Quality control apparatus and control method of the same,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Quality control apparatus and control method of the same,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Quality control apparatus and control method of the same,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3963327