Qualification signal measurement, trigger, and/or display...

Details Qualification signal measurement, trigger, and/or display... Qualification signal measurement, trigger, and/or display...

2006-01-24

2006-01-24

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S066000, C702S069000, C702S081000

Reexamination Certificate

active

06990416

ABSTRACT:
A qualification signal display, trigger, and/or measurement (MTD) system is disclosed. An embodiment comprises receiving an event, wherein the event comprises a signal waveform, comparing the event with a qualification specification, wherein the qualification specification provides criteria for determining whether an event is a qualified event, and responsive to determining that the event is a qualified event, providing an indication to an MTD device of each qualified event.

REFERENCES:
patent: 4791356 (1988-12-01), Warren et al.
patent: 6260167 (2001-07-01), Lo et al.
patent: 6834380 (2004-12-01), Khazei
Martron, Yokogawa; “New Combination Analyser for CANbus Environments”, Nov. 13, 2001.

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