Purity/beam landing error measurement method for electronic disp

Computer graphics processing and selective visual display system – Data responsive crt display control

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345 13, 345 14, 315 8, 315370, H04N 512

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active

060973552

ABSTRACT:
A method of calculating beam landing errors in an electronic display device having color phosphor elements and electron guns to generate electron beams to impinge on corresponding phosphor elements require a magnetic field to be generated to deflect an electron beam relative to the corresponding phosphor element on which the electron beam is to impinge. The intensity of light emitted by the phosphor elements in the measurement area is measured as the electron beam impinges thereon. The polarity of the magnetic field is reversed and the above step is repeated. Thereafter, the magnitude of the magnetic field is changed and the above two steps are repeated thereby to measure at least two different light intensities resulting from electron beam influenced by each polarity magnetic field. The at least two different light intensities resulting from electron beams influenced by each polarity magnetic field are then approximated with straight lines and an intersection point of the straight lines is determined. A corresponding magnetic field to the intersection point is also determined. A magnetic field is then generated corresponding to the intersection point and the intensity of light emitted by the phosphor element as the electron beam impinges thereon is measured. A beam landing error is then calculated using a characteristic of the phosphor element and at least some of the measured light intensities and corresponding generated magnetic fields.

REFERENCES:
patent: 3723801 (1973-03-01), Osenham
patent: 3962722 (1976-06-01), Ciciora
patent: 3975766 (1976-08-01), Sano et al.
patent: 4001877 (1977-01-01), Simpson
patent: 4035834 (1977-07-01), Drury
patent: 4330779 (1982-05-01), Wilensky et al.
patent: 4415921 (1983-11-01), Mulvanny et al.
patent: 4575753 (1986-03-01), Mistry et al.
patent: 4602272 (1986-07-01), Duschl
patent: 4635095 (1987-01-01), Legrand et al.
patent: 4688079 (1987-08-01), Fendley
patent: 4751570 (1988-06-01), Robinson
patent: 4754329 (1988-06-01), Lindsay et al.
patent: 4760444 (1988-07-01), Nielson et la.
patent: 4814858 (1989-03-01), Mochizuki et al.
patent: 4893925 (1990-01-01), Sweeny et al.
patent: 4925420 (1990-05-01), Fourche et al.
patent: 5032769 (1991-07-01), Kawakami
patent: 5049791 (1991-09-01), Kawakami
patent: 5216504 (1993-06-01), Webb et al.
patent: 5260627 (1993-11-01), Yokota et al.
patent: 5339010 (1994-08-01), Urata et al.
patent: 5371537 (1994-12-01), Bohan et al.
patent: 5404164 (1995-04-01), Hassler et al.
patent: 5557297 (1996-09-01), Sharp et al.
patent: 5583401 (1996-12-01), Inoue et al.
patent: 5642175 (1997-06-01), Hirakawa
patent: 5969756 (1999-10-01), Buckley et al.
Kim, S. R. et al., "Design and Implementation of an Automatic Adjustment System for Integrated Tube Components", Mechatronics, vol. 4., No. 1, pp. 1-23, Oxford; Great Britian.
Lin, Robert, Jr., "Automated CRT inspection and Alignment", Information Display, vol. 4, No. 6, 8, pp. 16-17.
Hibara, T., et al. "Automatic Adjustment for Color Display Monitor" Proceedings of 1986 International Conference on Industrial Electronics, Control & Instrumentation IECON), Milwaukee WI, pp. 164-169.
Minolta CRT Focus Meter CB-150 brochure (updated).
WWW.Minolta.com web site regarding Minolta CRT Focus Meter.

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