Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2006-03-21
2006-03-21
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By polarized light examination
C356S365000, C356S437000, C356S439000, C356S440000
Reexamination Certificate
active
07016039
ABSTRACT:
Purging of a light beam path in an effective manner that minimizes the affect of the purging requirement on system throughput. In one embodiment, the invention is incorporated into a birefringence measurement system that has several components for directing light through a sample optical element and thereafter detecting and analyzing the light. The segment of the beam path through the sample is isolated to reduce the volume that requires continual purging.
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Breninger Andrew O.
Griffiths Christopher O.
Mark Douglas C.
Mikheyev Artemiy
Wang Baoliang
Hinds Instruments, Inc.
Ipsolon LLP
Punnoose Roy M.
Toatley , Jr. Gregory J.
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