Purging light beam paths in optical equipment

Optics: measuring and testing – By polarized light examination

Reexamination Certificate

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C356S365000, C356S437000, C356S439000, C356S440000

Reexamination Certificate

active

07016039

ABSTRACT:
Purging of a light beam path in an effective manner that minimizes the affect of the purging requirement on system throughput. In one embodiment, the invention is incorporated into a birefringence measurement system that has several components for directing light through a sample optical element and thereafter detecting and analyzing the light. The segment of the beam path through the sample is isolated to reduce the volume that requires continual purging.

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