Pump probe measuring device and scanning probe microscope...

Optical: systems and elements – Optical frequency converter – Optical laser acoustic delay line type

Reexamination Certificate

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C359S326000, C850S006000, C850S021000, C250S310000, C250S306000, C073S800000

Reexamination Certificate

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07961379

ABSTRACT:
A pump probe measuring device (1) includes an ultrashort optical pulse laser generator (11) for generating a first ultrashort optical pulse train, which becomes a pump light, and a second ultrashort optical pulse train, which becomes a probe light, a delay time adjusting unit (15) for adjusting a delay time between ultrashort optical pulse trains, a first pulse picker and a second pulse picker (13, 14) for accepting each of the first and the second ultrashort optical pulse trains and allowing only one pulse to be transmitted at an arbitrary repetition periodicity, thus reducing the effective repetition frequency of the optical pulses, a delay time modulation unit (10) for periodically changing a position through which pulses are transmitted by the first and the second pulse pickers (13, 14), an irradiation optical system (16) for applying pump light and probe light to a sample (19), a measuring unit (20) for detecting probe signals from a sample (19), and a lock-in amplifier (18).

REFERENCES:
patent: 5748318 (1998-05-01), Maris et al.
patent: 5959735 (1999-09-01), Maris et al.
patent: 6111416 (2000-08-01), Zhang et al.
patent: 6175416 (2001-01-01), Maris et al.
patent: 6208421 (2001-03-01), Maris et al.
patent: 6271921 (2001-08-01), Maris et al.
patent: 6321601 (2001-11-01), Maris et al.
patent: 6400449 (2002-06-01), Maris et al.
patent: 7002149 (2006-02-01), Shigekawa et al.
patent: 7508853 (2009-03-01), Harter et al.
patent: 2001/0028460 (2001-10-01), Maris et al.
patent: 2002/0018210 (2002-02-01), Maris
patent: 2005/0035288 (2005-02-01), Shigekawa et al.
patent: 10-233544 (1998-09-01), None
patent: 2000-515624 (2000-11-01), None
patent: 03-046519 (2003-06-01), None
International Search Report (ISR) for PCT/JP2007/072988, citing U.S. Patent Nos. 1-8, U.S. Patent Application Publications Nos. 1-3, Foreign Patent Documents Nos. 1-3, and Non-Patent Literature Nos. 2-3.
Kensuke Ogawa, “Femtosecond spectrum sampling technology and its applications to nonlinear spectroscopy of semiconductors”, Technical report of IEICE LQE, vol. 98, No. 342, Oct. 21, 1998, pp. 59-64.
Bartels et al., “Femtosecond time-resolved optical pump-probe spectroscopy at kilohertz-scan-rates over nanosecond-time-delays without mechanical delay line” Applied Physics Letters, vol. 88, Issue 4, Jan. 25, 2006, ID. 041117.
Translation of PCT/ISA/237 of PCT/JP2007/072988 with IB338 and IB373.

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