Pulsed thermal monitor

Details Pulsed thermal monitor Pulsed thermal monitor

2006-04-25

2006-04-25

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C702S130000, C713S322000

Reexamination Certificate

active

07034556

ABSTRACT:
A power solid-state device is pulsed from a controlled pulse source, which generates heat in the chip. Similar or identical pulses are applied to a software or equivalent electrical hardware temperature simulator, for predicting the chip temperature. The output of the simulator is monitored, and the controlled pulse source is inhibited in the event that the predicted chip temperature exceeds a limit. A delay may be introduced between the pulse generation and application to the chip. Additional temperatures associated with the chip heat sink may be combined with the chip temperature.

REFERENCES:
patent: 5557551 (1996-09-01), Craft
patent: 6487668 (2002-11-01), Thomas et al.
patent: 6557072 (2003-04-01), Osborn
patent: 6650132 (2003-11-01), Pelissier
patent: 6704876 (2004-03-01), Iacobovici et al.
Dr. Martin Marz, Paul Nance, Infineon Technologies AG, Munich,Thermal Modeling of Power-Electronic Systems, pp. 1-20, (date unavailable).

Affiliated with

Also associated with

Rating

Pulsed thermal monitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pulsed thermal monitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pulsed thermal monitor will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3553157