Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1972-05-25
1986-05-20
Buczinski, S. C.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356355, 356357, 356345, G01B 902, G01B 1102
Patent
active
045897727
ABSTRACT:
A method for measuring the separation between two spaced light-reflecting rfaces by means of a single laser pulse. The reflected light is divided into two beams which are then projected at the same angle .theta. onto the same area on a photographic film to form interference fringes. The film is developed, placed on a translating platform, and passed through the beam of a CW laser, a portion of the beam being diffracted by the interference fringes recorded on the film. The distance .chi. between the high-intensity points of adjacent interference regions is measured and the separation of the two light reflecting surfaces is calculated from the formula d=.chi. sin .theta..
REFERENCES:
patent: 3424532 (1969-01-01), Briggs et al.
patent: 3709610 (1973-01-01), Kruegle
Dotson, Jr. et al.; NASA Tech. Notes D-5515; Nov. 1969; 356-28.5.
Friesen et al.; Appl. Optics; vol. 6, #5; May 1967.
Blodgett Jerry A.
Patten Raymond A.
Beers Robert F.
Buczinski S. C.
Ellis William T.
The United States of America as represented by the Secretary of
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