Pulsed plasma probe

Details Pulsed plasma probe Pulsed plasma probe

1976-01-30

1977-02-01

Smith, Alfred E.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

250526, 324 72, G01J 100, G01N 2700

Patent

active

040064042

ABSTRACT:
Method and apparatus for Langmuir probe plasma diagnostics employing an etronically controlled, discontinuous, modulated sweep of pulses in which the pulse amplitude follows a sawtooth envelope. The pulse organization procedure is such that the probe rests at a baseline potential for a period which is much longer than the pulse width and current-voltage data points are generated by each pulse. The distortions that can result when probe surface conditions change within the measurement period are eliminated by maintaining a single probe surface condition throughout the collection period of the current-voltage characteristic.

REFERENCES:
patent: 2996664 (1961-08-01), Vogel et al.
patent: 3432659 (1969-03-01), Elton
patent: 3614606 (1971-10-01), Schmidt
patent: 3767929 (1973-10-01), Shohet et al.

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