Pulsed ion source for quadrupole mass spectrometer and method

Details Pulsed ion source for quadrupole mass spectrometer and method Pulsed ion source for quadrupole mass spectrometer and method

2008-01-29

2008-01-29

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

C250S286000, C250S287000, C250S288000, C250S292000, C250S3960ML

Reexamination Certificate

active

07323682

ABSTRACT:
A variable duty cycle ion source assembly is coupled to a continuous beam mass spectrometer. The duty cycle can be adjusted based on previous scan data or real time sampling of ion intensities during mass analysis. This provides the ability to control the total number of ions formed, mass analyzed and detected for each ion mass of interest. The frequency of the ion source can be sufficiently high (kHz range) so as to maintain accurate peak centroiding. The ion source assembly can be used for both electron ionization (EI) or chemical ionization (CI) modes of operation.

REFERENCES:
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patent: 5756996 (1998-05-01), Bier et al.
patent: 6294780 (2001-09-01), Wells et al.
patent: 6573496 (2003-06-01), Harada
patent: 2005/0194543 (2005-09-01), Hieke
patent: 0905743 (1999-03-01), None
patent: WO0077824 (2000-12-01), None

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