Pulsed I-V measurement method and apparatus

Details Pulsed I-V measurement method and apparatus Pulsed I-V measurement method and apparatus

2007-02-08

2009-11-10

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S762010, C257S048000

Reexamination Certificate

active

07616014

ABSTRACT:
A method and apparatus for measuring a pulsed I-V characteristic of a DUT that has a signal terminal and a return terminal includes connecting a pulse unit between the signal and return terminals, the pulse unit having a pulse source and a pulsed current measuring device; pulsing the signal terminal with the pulse unit; measuring a pulsed current through the signal terminal with the current measuring device in response to the pulsing; and outputting, storing, displaying, or otherwise using the current measurement.

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patent: 6998869 (2006-02-01), Tanida et al.
patent: 7242200 (2007-07-01), Okawa
Efficient Microwave Bias and Testing Using the HP 4142B Modular DC Source/Monitor. Hewlett Packard. Application Note 1205 (Date: At least as early as Aug. 30, 2006.).

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