Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2008-08-28
2011-11-22
Dunn, Drew A (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S089000, C368S113000, C368S118000, C368S120000
Reexamination Certificate
active
08065102
ABSTRACT:
A pulse width measurement circuit generates a time difference signal that corresponds to the pulse width of the input pulse signal PULSE. A delay circuit delays the input pulse signal PULSE by a predetermined amount, and outputs a start signal. An inverter inverts the input pulse signal PULSE, and outputs a stop signal. A time measurement circuit measures the time difference between a positive edge in the start signal and a positive edge in the stop signal, and outputs a time difference signal that corresponds to the time difference.
REFERENCES:
patent: 4719608 (1988-01-01), Genat et al.
patent: 5694377 (1997-12-01), Kushnick
patent: 5969555 (1999-10-01), Suda
patent: 7196778 (2007-03-01), Lin et al.
patent: 7564284 (2009-07-01), Henzler et al.
patent: 2003/0038646 (2003-02-01), Furukawa
patent: 2006/0197567 (2006-09-01), Jakobs et al.
patent: 2007/0226670 (2007-09-01), Yamamoto
patent: 2008/0111720 (2008-05-01), Huang et al.
patent: 2009/0072812 (2009-03-01), Henzler et al.
patent: 2009/0236532 (2009-09-01), Frach et al.
Advantest Corporation
Dunn Drew A
Martine Penilla Group LLP
Park Hyun
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