Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate
2008-04-14
2009-08-11
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
C327S149000
Reexamination Certificate
active
07574316
ABSTRACT:
A semiconductor test apparatus to test a semiconductor circuit includes a pattern generator which generates a test pattern for testing the semiconductor circuit, a waveform shaper which shapes a test signal to be supplied to the semiconductor circuit based on the test pattern, a pulse width adjusting circuit which generates a timing signal for determining a phase of the test signal by adjusting a pulse width of an input pulse signal and outputs the timing signal to the waveform shaper, and a judging section which judges whether the semiconductor circuit is good or bad based on an output signal output from the semiconductor circuit. The pulse width adjusting circuit includes a first delay circuit which outputs a first delay signal generated by delaying the pulse signal by a certain delay time, a second delay circuit which outputs a second delay signal generated by delaying the pulse signal by a different delay time from the first delay circuit, and an output section which, in accordance with the first and second delay signals, generates and outputs the timing signal having a pulse width corresponding to a difference between the delay times respectively achieved by the first and second delay circuits.
REFERENCES:
patent: 2007/0139102 (2007-06-01), Laletin
U.S. Appl. No. 11/487,897, mailed Apr. 18, 2008, 7 pages.
Kantake Shusuke
Suda Masakatsu
Advantest Corporation
Osha • Liang LLP
Raymond Edward
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