Pulse heating-time of flight mass spectrometric gas elements...

Details Pulse heating-time of flight mass spectrometric gas elements... Pulse heating-time of flight mass spectrometric gas elements...

2008-10-28

2010-12-07

Souw, Bernard E (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

C250S288000

Reexamination Certificate

active

07847242

ABSTRACT:
A pulse heating—time of flight mass spectrometric gas elements analyzer, which involves the chemical analysis field of inorganic materials, and comprises of a pulse heating electrode furnace, a sample charging system, a purification device, a time-of-flight mass spectrometer, a signal acquisition and data processing system, and an automatic control system. Said electrode furnace and sample charging system are united as one via upper/lower electrodes and pneumatic cylinders, to form a closed hearth. Said electrode furnace, purification device and time-of-flight mass spectrometer are interconnected through the gas pipelines: the purified inert carrier gas comes into the hearth from its top, carrying out the gas components released from sample fusion, and upon re-purification, comes into the time-of-flight mass spectrometer; said signal acquisition and data processing system is connected to the detector of the said mass spectrometer via signal cables, and on the basis of computation by the data processing module of the relevant computer software, outputs the mass percentages of O, N, H and Ar in the sample. The lower limit of detection can be below 0.01 ppm to 0.1 ppm, and no less than three elements can be measured simultaneously in one analysis cycle.

REFERENCES:
patent: 6573493 (2003-06-01), Futami et al.
patent: 2009/0032695 (2009-02-01), Kaye et al.
patent: 2009/0056537 (2009-03-01), Neumann
patent: 2009/0094893 (2009-04-01), Neumann
Wang, et al., A novel assembly gas analyzer for metallurgical materials by inert gas fusion & time-of-flight mass spectrometry, Metallurgical Analysis 28, Suppl. 1, pp. 109-119 (Nov. 2008).

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