Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1992-09-04
1994-03-08
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
371 221, 371 223, G01R 3128
Patent
active
052931234
ABSTRACT:
Disclosed is a circuit configuration that permits the monitoring of the operation of an input/output circuit of a digital unit under test by pseudo-random scan test techniques. A resistive element couples test signals to an input/output terminal of the device under test to which the input/output circuit is connected. The connection between the resistive element and the terminal is monitored during pseudo-random scan testing, permitting testing of the input/output circuitry.
REFERENCES:
patent: 3829770 (1974-08-01), Stevens
patent: 4216539 (1980-08-01), Raymond et al.
patent: 4441074 (1984-04-01), Bockett-Pugh
patent: 4455654 (1984-06-01), Bhaskar et al.
patent: 4546313 (1985-10-01), Moyer
patent: 4583223 (1986-04-01), Inoue et al.
patent: 4682330 (1987-07-01), Millham
patent: 4703484 (1985-12-01), Rolfe et al.
patent: 4718065 (1988-01-01), Boyle et al.
patent: 4763066 (1988-08-01), Yeung
patent: 4764925 (1988-08-01), Grimes et al.
patent: 4768195 (1988-08-01), Stoner et al.
patent: 4768196 (1988-08-01), Jou et al.
patent: 4817093 (1989-03-01), Jacobs et al.
patent: 4827476 (1989-05-01), Garcia
patent: 4835458 (1989-05-01), Kim
patent: 4875003 (1989-10-01), Burke
patent: 4879717 (1989-11-01), Sauerwald et al.
patent: 4907230 (1990-03-01), Heller et al.
patent: 5012185 (1991-04-01), Ohfuji
patent: 5032783 (1991-07-01), Hwang et al.
patent: 5068599 (1991-11-01), Niehaus
patent: 5068604 (1991-11-01), Van de Lagemaat
patent: 5072175 (1991-12-01), Marek
Fu Peter L.
Garcia David J.
Jordan Albert
Karlsen Ernest F.
Tandem Computers Incorporated
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