Data processing: measuring – calibrating – or testing – Calibration or correction system – Temperature
Reexamination Certificate
2005-05-04
2008-07-08
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Temperature
Reexamination Certificate
active
07398173
ABSTRACT:
Sensors and/or transducers can exhibit nonlinear response to temperature changes in terms of offset and also in terms of sensitivity to variations in a sensed physical attribute (pressure, strain, displacement, etc.). Padé Approximant function emulators are used to model the nonlinear offset and/or nonlinear sensitivity behaviors of a given sensing device relative to one or more temperature sub-ranges and to produce temperature compensating corrections for offset and/or sensitivity as may be desired.
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International Search Report, PCT/US06/015793, mailing date Aug. 14, 2006.
Laraia Jose Marcos
Willis David John
AMI Semiconductor Inc.
MacPherson Kwok & Chen & Heid LLP
Nghiem Michael P
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