Data processing: measuring – calibrating – or testing – Calibration or correction system – Temperature
Reexamination Certificate
2011-08-02
2011-08-02
Nghiem, Michael P (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Temperature
C702S104000
Reexamination Certificate
active
07991571
ABSTRACT:
Pade Approximant function emulators are used to model the nonlinear offset and/or nonlinear sensitivity behaviors of a sensor relative to temperature sub-ranges and to produce temperature compensating corrections for both offset and sensitivity as desired. In order to avoid use of brute force division for generating the Pade Approximant function signals, in one set of embodiments, feedback is used to provide a corresponding effect. In order to minimize the number of coefficients that are to be resolved and stored, in one set of embodiments, first or higher order Pade Approximants with normalized denominators are used so that each function can be defined with just three coefficients. Embodiments that are more analog in nature or more digital in nature are disclosed. Methods for resolving the Pade Approximant coefficients and calibrating each sensor unit on a mass production basis are also disclosed.
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Laraia Jose Marcos
Willis David John
Haynes and Boone LLP
Nghiem Michael P
Semiconductor Components Industries LLC
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