Providing increased number of measurements and deeper depth...

Details Providing increased number of measurements and deeper depth... Providing increased number of measurements and deeper depth...

2007-07-23

2010-06-29

Lau, Tung S (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Earth science

Reexamination Certificate

active

07747387

ABSTRACT:
Resistivity measurements are made with a propagation resistivity tool in a plurality of different modes wherein the antennas may be used as both transmitters or receivers. It is emphasized that this abstract is provided to comply with the rules requiring an abstract which will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

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patent: 5892361 (1999-04-01), Meyer, Jr. et al.
patent: 6211678 (2001-04-01), Hagiwara
patent: 6353321 (2002-03-01), Bittar

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