Providing accurate detection of chip overheat and local...

Details Providing accurate detection of chip overheat and local... Providing accurate detection of chip overheat and local...

2008-01-22

2008-01-22

Sherry, Michael (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

Circuit interruption by thermal sensing

Reexamination Certificate

active

07321484

ABSTRACT:
A thermal shutdown system that can accurately detect a chip overheat condition or a local overheat condition is described. This system can include a first shutdown circuit triggered by the chip overheat condition and a second shutdown circuit triggered by the local overheat condition. The second shutdown circuit can be located near the heat-generating component on the IC. The first shutdown circuit can be located in another area of the IC. A common temperature independent signal, which indicates whether a local overheat condition is anticipated, can enable one shutdown circuit and disable the other shutdown circuit. An enabled shutdown circuit can respond to a temperature sensitive signal to indicate a fault condition, i.e. Ea chip/local overheat condition.

REFERENCES:
patent: 5675297 (1997-10-01), Gose et al.
patent: 6061221 (2000-05-01), Tihanyi
patent: 6351360 (2002-02-01), Kotowski et al.
patent: 6624995 (2003-09-01), Barrow et al.
patent: 7123995 (2006-10-01), Desai et al.
Data Sheet entitled: “2 A, High-Side P-Channel Switch With Current Limit And Thermal Shutdown”, 2003 Analog Devices, Inc., pp. 1-8.
Data Sheet entitled: “Programmable Current Limit High-Side Switch”, MIC2544/2548, 2004 Micrel, Incorporated, pp. 1-12.

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