Providing a partial column defect map for a full frame image...

Details Providing a partial column defect map for a full frame image... Providing a partial column defect map for a full frame image...

2006-01-17

2006-01-17

Williams, Kimberly (Department: 2626)

Facsimile and static presentation processing

Static presentation processing

Data corruption, power interruption, or print prevention

C358S437000, C348S246000

Reexamination Certificate

active

06987577

ABSTRACT:
A method for determining defects in an image sensor, which identifies one or more partial column defects, including capturing a digital image using the image sensor and storing such digital image in a memory; identifying at least one column in the digital image which has corrupted data caused by one or more defective pixels in the image sensor; processing the digital image data from the at least one identified column using an extended differentiation filter; and using the output of the extended differentiation filter to identify a starting position or an ending position of the partial column defect.

REFERENCES:
patent: 3971065 (1976-07-01), Bayer
patent: 6181376 (2001-01-01), Rashkovskiy et al.
patent: 6611288 (2003-08-01), Fossum et al.
patent: 6819358 (2004-11-01), Kagle et al.
Solid-State Imaging with Charge-Coupled Devicesby Albert J.P. Theuwissen.

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