Protective circuit for electronic test probes

Details Protective circuit for electronic test probes Protective circuit for electronic test probes

1982-12-15

1985-04-09

Envall, Jr., Roy N.

Electrical resistors

Resistance value responsive to a condition

Current and/or voltage

338 23, 361103, 361106, G01K 716, H02H 504

Patent

active

045104824

ABSTRACT:
A resistor device comprises a first film of resistive material deposited on a dielectric substrate and having two terminal portions for connection to an electrical circuit, and a second film of resistive material deposited on the substrate in thermally-conductive contact with the first film and electrically isolated therefrom. The material of one of the films has a relatively high temperature coefficient of resistance, so that the resistance of that film can be utilized as an indication of the temperature of the other film.

REFERENCES:
patent: 2438495 (1948-03-01), Chatterjea
patent: 3017564 (1962-01-01), Barney
patent: 3503030 (1970-03-01), Matsumoto et al.
patent: 3505632 (1970-04-01), Matsuzaki et al.
patent: 3526809 (1970-09-01), Obenhaus
patent: 3621446 (1971-11-01), Smith et al.
patent: 3843949 (1974-10-01), Plough et al.
patent: 4068281 (1978-01-01), Harnden
patent: 4160969 (1979-07-01), Holmes
patent: 4450496 (1984-05-01), Doljack et al.
patent: 4467386 (1984-08-01), Wasson
Van Steensel et al., "Thin Film Switching Elements of VO.sub.2 ", Phillips Research Reports, vol. 22, 1967, pp. 170-177.
Bruck et al., "Why the Design Nod Goes to Resistors Made as Thin-Film Monolithic Networks", Electronics, Aug. 3, 1978, pp. 99-104.

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