Protection structure for protection from electrostatic...

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Having only two terminals and no control electrode – e.g.,...

Reexamination Certificate

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C257S173000, C257S146000

Reexamination Certificate

active

07023028

ABSTRACT:
An ESD protection structure for protecting an integrated circuit from electrostatic discharge, having a bipolar protection element, whose emitter is formed by an emitter zone of the first conduction type, whose collector is formed by a buried layer of the first conduction type, and whose base is formed by a base zone of the second conduction type disposed in-between. The base zone is spaced apart from the buried layer by an intermediate layer. Highly and lightly doped regions alternatively are provided in a section of the buried layer. The highly doped regions are spaced apart from one another by the lightly doped regions. A region with a reduced breakdown voltage of the protection element is disposed in a part of the protection element spaced apart from the section of the buried layer. Also provided is an integrated circuit having such an ESD protection structure.

REFERENCES:
patent: 5747834 (1998-05-01), Chen et al.
patent: 6194764 (2001-02-01), Gossner et al.
patent: 6320232 (2001-11-01), Gossner et al.
patent: 6441437 (2002-08-01), Gossner
patent: 197 43 240 (1999-04-01), None
patent: 0 905 782 (1999-03-01), None
patent: 1 019 964 (2000-07-01), None

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