Protection structure against electrostatic discharges (ESD)...

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Device protection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S174000, C257S355000, C257S356000, C257S509000, C257S510000

Reexamination Certificate

active

06891208

ABSTRACT:
A protection structure against electrostatic discharges for a semiconductor electronic device that is integrated inside a well is disclosed, wherein the well is formed on a SOI substrate and isolated dielectrically by a buried oxide layer and an isolation structure, which isolation structure includes in turn at least a dielectric trench filled with a filler material. Advantageously, the protection structure is formed at the isolation structure.

REFERENCES:
patent: 5650354 (1997-07-01), Himi et al.
patent: 6074899 (2000-06-01), Voldman
patent: 6232163 (2001-05-01), Voldman et al.
patent: 6573566 (2001-06-01), Ker et al.
patent: 20010015429 (2001-08-01), Leonardi et al.
patent: 20010022384 (2001-09-01), Leonardi et al.
patent: 20020086467 (2002-07-01), Chang et al.
patent: 20020153564 (2002-10-01), Shirai
patent: 7-29974 (1995-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Protection structure against electrostatic discharges (ESD)... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Protection structure against electrostatic discharges (ESD)..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Protection structure against electrostatic discharges (ESD)... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3405121

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.