Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Amplitude control
Patent
1997-04-08
2000-05-02
Cunningham, Terry D.
Miscellaneous active electrical nonlinear devices, circuits, and
Signal converting, shaping, or generating
Amplitude control
327321, H03K 508
Patent
active
060577258
ABSTRACT:
A multi-phase charge pump continuously pumps to establish a DC voltage outside the range of supply and reference voltages. The multi-phase charge pump in one embodiment includes four stages operating in a ring with a four-phase clock. Each stage includes a three-mode charge pump that generates and provides reset and control signals to other stages. Each stage includes a pass transistor having a gate driven in excess of the DC voltage for efficient transfer of charge. The gate drive signal from a first stage is coupled to a next stage in the ring where it is used to generate the next gate drive signal. Each gate drive signal corresponds to one waveform having a phase skewed in time so that each stage in the ring is operating in a different mode. In a method of use, a first stepped voltage is developed on a first capacitor and selectively coupled to a second capacitor to develop a second stepped voltage of greater absolute value. The second stepped voltage gates charge transfer from a first stage and enables the selective coupling in a next stage in a sequence of pump stages. The pump stages include protection circuits protecting high-voltage nodes during burn-in testing. The charge pump includes a burn-in detector circuit for detecting burn-in conditions and for turning on the protection circuits and a pump regulator for regulating the output of the charge pump.
REFERENCES:
patent: 4583157 (1986-04-01), Kirsch et al.
patent: 4631421 (1986-12-01), Inoue et al.
patent: 4729873 (1988-03-01), Shulz
patent: 4733108 (1988-03-01), Truong
patent: 4807104 (1989-02-01), Floyd et al.
patent: 4843256 (1989-06-01), Scade et al.
patent: 4874967 (1989-10-01), Deane
patent: 4961007 (1990-10-01), Kumanoya et al.
patent: 4970409 (1990-11-01), Wada et al.
patent: 5029282 (1991-07-01), Ito
patent: 5034625 (1991-07-01), Min et al.
patent: 5093279 (1992-03-01), Andreshak et al.
patent: 5179296 (1993-01-01), Ito
patent: 5180928 (1993-01-01), Choi
patent: 5182468 (1993-01-01), Erdelyi et al.
patent: 5196996 (1993-03-01), Oh
patent: 5202588 (1993-04-01), Matsuo et al.
patent: 5262354 (1993-11-01), Cote et al.
patent: 5266842 (1993-11-01), Park
patent: 5281549 (1994-01-01), Fazan et al.
patent: 5301097 (1994-04-01), McDaniel
patent: 5304859 (1994-04-01), Arimoto
patent: 5343088 (1994-08-01), Jeon
patent: 5371047 (1994-12-01), Greco et al.
patent: 5448199 (1995-09-01), Park
patent: 5510749 (1996-04-01), Arimoto
patent: 5528189 (1996-06-01), Khatibzadeh
patent: 5914626 (1999-06-01), Kim et al.
patent: 5946242 (1999-08-01), Cho et al.
Cunningham Terry D.
Micro)n Technology, Inc.
LandOfFree
Protection circuit for use during burn-in testing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Protection circuit for use during burn-in testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Protection circuit for use during burn-in testing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1596747