Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2005-02-28
2008-09-30
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C327S512000, C702S130000
Reexamination Certificate
active
07429129
ABSTRACT:
A temperature sensor circuit and system providing accurate digital temperature readings using a local or remote temperature diode. In one set of embodiments a change in diode junction voltage (ΔVBE) proportional to the temperature of the diode is captured and provided to an analog to digital converter (ADC), which may perform required signal conditioning functions on ΔVBE, and provide a digital output corresponding to the temperature of the diode. DC components of errors in the measured temperature that may result from EMI noise modulating the junction voltage (VBE) may be minimized through the use of a front-end sample-and-hold circuit coupled between the diode and the ADC, in combination with a shunt capacitor coupled across the diode junction. The sample-and-hold-circuit may sample VBEat a frequency that provides sufficient settling time for each VBEsample, and provide corresponding stable ΔVBEsamples to the ADC at the ADC operating frequency. The ADC may therefore be operated at its preferred sampling frequency rate without incurring reading errors while still averaging out AC components of additional errors induced by sources other than EMI.
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McLeod Scott C.
St. Pierre Robert
Hood Jeffrey C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Standard Microsystems Corporation
Verbitsky Gail
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