Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2005-03-29
2005-03-29
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
C250S214100, C359S199200
Reexamination Certificate
active
06873405
ABSTRACT:
A propagation measuring apparatus for measuring propagation characteristics of an object to be measured includes a first light source for outputting a first optical signal of a first frequency, a second light source for outputting a second optical signal of a second frequency, a terahertz light outputting unit for generating terahertz light of a frequency, which is equal to a difference between the first and second frequencies, by using the first and second optical signals and radiating the terahertz light to the object to be measured, a first detecting unit for detecting the terahertz light passing through the object to be measured and a measuring unit for measuring the propagation characteristics of the object to be measured based on the terahertz light detected by the first detecting unit.
REFERENCES:
patent: 5150248 (1992-09-01), Alfano et al.
patent: 5256968 (1993-10-01), Loualiche et al.
patent: 6144679 (2000-11-01), Herman et al.
patent: 6348683 (2002-02-01), Verghese et al.
patent: 6525862 (2003-02-01), Fisher et al.
patent: 6563622 (2003-05-01), Mueller et al.
patent: 6661519 (2003-12-01), Fukasawa
patent: 6738397 (2004-05-01), Yamamoto et al.
patent: 6747736 (2004-06-01), Takahashi
patent: 2-150747 (1990-06-01), None
patent: 2000-121550 (2000-04-01), None
patent: 2001-21503 (2001-01-01), None
S. Matsuura et al., “A Tunable Cavity-Locked Diode Laser Source for Terahertz Photomixing,” IEEE Transactions of Microwave Theory and Techniques; Mar. 2000, vol. 48, No. 3, pp. 380-387.
S. Matsuura et al., “High-Resolution Terahertz Spectroscopy by a Compact Radiation Source Based on Photomixing with Diode Lasers in a Photoconductive Antenna,” Journal of Molecular Spectroscopy, 1998nen, vol. 187, pp. 97-101.
Int'l. Search Report issued in Int'l. Application No. PCT/JP02/06175 mailed Jul. 30, 2002, 2 pgs.
“The Frontiers of Information and Communication Research, All of Communications Research Laboratory”; (The third chapter: The Exploitation of Frequency Resources, 10 TerahertzElectronics; Dempa Shimbun-sha) (7 pgs.).
“Chromatic Dispersion Measurement Over A 100km Dispersion-Shifted Single-Mode Fibre by a New Phase-Shift Technique” vol. 22, No. 11, May 22, 1986; Electronics Letters; pp. 570-572 (3 pgs.).
Shiro Ryu, et al.; “Novel Chromatic Dispersion Measurement Method Over Continuous Gigahertz Tuning Range”; Journal of Lightwave Technology, vol. 7, No. 8, Aug. 1989; pp. 1177-1180; IEEE (4 pgs.).
Kido Takashi
Niki Shoji
Advantest Corporation
Nguyen Sang H.
Osha & May L.L.P.
Toatley , Jr. Gregory J.
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