PROM IC with a margin test function

Details PROM IC with a margin test function PROM IC with a margin test function

1992-10-14

1994-03-22

LaRoche, Eugene R.

Static information storage and retrieval

Addressing

365185, 365201, G11C 1300

Patent

active

052971015

ABSTRACT:
A PROM IC including sense circuits, each including a sense amplifier. A pull-up resistor circuit whose resistance value is variable is provided on the side of an input of the sense amplifier so that, upon a reception of a test selection signal, the resistance value of the resistor circuit is changed to a value with which a drive condition of current flowing through a selected memory cell becomes severe.

REFERENCES:
patent: 4779272 (1988-10-01), Kohda et al.
patent: 5142496 (1992-08-01), Van Buskirk

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