Projection system visual characteristics analyzer

Optics: measuring and testing – Lamp beam direction or pattern

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Details

356213, 356218, G01J 100, G01J 142

Patent

active

058185976

ABSTRACT:
The present invention is a system and method to expeditiously and accurately measure the luminance, weave, jump and flicker of an object so that the best luminance available for that object may be achieved by making adjustments to the light source, the reflecting surface and the like. A scanning light receiver which produces a two dimensional optical image of the object whose luminance is to be tested, is set up so that it may view a substantial portion of the object. The light receiver is connected to a analyzer and interface unit ("AIU") to which it sends an electronic image representing the reflected luminance of the object during each scan. The reflected light that is detected by the light receiver is then analyzed by the AIU to determine the luminance levels, weave, jump and flicker of the luminance across a substantial portion of the object by measuring the voltage of each pixel detected by the light receiver measured against the voltage produced by a black level.

REFERENCES:
patent: 2431575 (1947-11-01), McCune
patent: 2831054 (1958-04-01), Harris
patent: 5067811 (1991-11-01), Ouchi
patent: 5164785 (1992-11-01), Hopkins et al.
patent: 5426500 (1995-06-01), Ohana

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