Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1996-04-10
1999-12-07
Hantis, K. P.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
G01B 1100
Patent
active
059992700
ABSTRACT:
A projection exposure apparatus includes an illumination optical system for illuminating a first object with exposure light, a projection optical system for projecting a pattern of the first object, illuminated by the exposure light from the illumination optical system, onto a second object, an alignment optical system for illuminating the second object with alignment light, having a wavelength different from the exposure light, and for detecting the alignment light from the second object through the projection optical system, and a moving device for placing the first object on the path of the alignment light when the projection optical system projects the pattern of the first object onto the second object by the exposure light, and for placing the first object out of the path of the alignment light when the alignment optical system detects the alignment light.
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Kosugi Masao
Mori Tetsuya
Canon Kabushiki Kaisha
Hantis K. P.
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