Projection apparatus for projecting a pattern formed on a...

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

Reexamination Certificate

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C250S492100, C250S492200

Reexamination Certificate

active

07034314

ABSTRACT:
A projection apparatus includes a charged particle beam source, a reduction lens, a charged particle shaping aperture having an arcuate opening, a collimator lens, and first and second projection lenses. A charged particle beam emerging from the charged particle beam source irradiates a mask placed on a mask stage to transfer a pattern on the mask onto a sample on a sample stage. The first and second projection lenses can move their first and second principal plane positions with an excitation strength ratio control circuit.

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patent: 0 838 837 (1998-04-01), None

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