Optics: measuring and testing – By alignment in lateral direction
Patent
1991-11-05
1993-10-12
Rosenberger, Richard A.
Optics: measuring and testing
By alignment in lateral direction
355 53, G01B 1100
Patent
active
052530400
ABSTRACT:
A projection aligner includes a light source, a condenser lens system for directing light from the light source onto a mask on which a circuit pattern is formed, a projecting lens system for collecting on the surface of a wafer the light transmitted through the mask, and an aperture member disposed between the light source and the condenser lens system. The aperture member includes a transmitting zone for transmitting light from the light source and a phase shift member for producing a predetermined phase difference between light transmitted through the transmitting zone and light transmitted through a region surrounding the transmitting zone.
REFERENCES:
patent: 3157087 (1964-11-01), Kallenberg
patent: 3892482 (1975-07-01), Weisglass
patent: 4257086 (1981-03-01), Gulliksen
patent: 4816876 (1989-03-01), Pryor
patent: 4970546 (1990-11-01), Suzuki et al.
patent: 4988188 (1991-01-01), Ohta
Kamon Kazuya
Miyamoto Teruo
Myoi Yasuhito
Noguchi Yoshie
Tanaka Masaaki
Hantis K. P.
Mitsubishi Denki & Kabushiki Kaisha
Rosenberger Richard A.
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