Programmatically generated in-circuit test of analog to digital

Details Programmatically generated in-circuit test of analog to digital Programmatically generated in-circuit test of analog to digital

1988-03-31

1990-08-07

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

341120, 371 224, G01R 1512, H03M 110, G06F 1122

Patent

active

049471066

ABSTRACT:
A device and process for programmatically controlled in-circuit pin checks and gross functionality tests of analog to digital converters. The tests provide deterministic bit checks for higher order bits and non-deterministic bit checks of lower order bits independent of other circuitry on the printed circuit board of which the digital to analog converter is a component.

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