Programmatically generated in-circuit test for general purpose o

Details Programmatically generated in-circuit test for general purpose o Programmatically generated in-circuit test for general purpose o

1988-03-31

1989-01-10

Wan, Gene

Amplifiers

With amplifier condition indicating or testing means

324 57R, G01R 2700

Patent

active

047976276

ABSTRACT:
A device and process for programmatically generated and controlled in-circuit pin tests and gross functionality tests of operational amplifiers. The tests provide basic functionality verification of amplifier functions independent of other circuitry on the printed circuit board of which the operational amplifier is a component.

REFERENCES:
patent: 2244751 (1941-06-01), Werrmann

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