Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2005-05-24
2005-05-24
Wilson, Christian (Department: 2824)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
C438S107000, C438S125000, C257S723000
Reexamination Certificate
active
06897078
ABSTRACT:
A multi-chip module comprising a low-temperature co-fired ceramic substrate having a first side on which are mounted active components and a second side on which are mounted passive components, wherein this segregation of components allows for hermetically sealing the active components with a cover while leaving accessible the passive components, and wherein the passive components are secured using a reflow soldering technique and are removable and replaceable so as to make the multi-chip module substantially programmable with regard to the passive components.
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Blazek Roy J.
Kautz David
Morgenstern Howard
Honeywell Federal Manufacturing & Technologies
Hovey & Williams, LLP
Wilson Christian
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