Programmable logic array with self correction of faults

Details Programmable logic array with self correction of faults Programmable logic array with self correction of faults

1981-04-14

1983-04-19

Atkinson, Charles E.

Excavating

307465, 364716, 371 20, G01R 3128, G11C 2900

Patent

active

043808115

ABSTRACT:
An apparatus and a method to automatically locate defects and to automatically insert and personalize dummy lines in a PLA having latches controlling the cross points of the AND and OR array. Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the PLA and which initiates a test procedure. The cross point latches are automatically loaded with test patterns and the output of the PLA is analyzed to locate the defective part, for example, a damaged cross point transistor, short circuited or open line. The dummy lines are repersonalized automatically to replace lines which are defective themselves or which are connected to defective crosspoints.

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