Programmable logic array with dynamic test capability in the unp

Details Programmable logic array with dynamic test capability in the unp Programmable logic array with dynamic test capability in the unp

1983-03-10

1985-02-12

Atkinson, Charles E.

Excavating

324 73R, 371 25, G01R 3128, G06F 1100

Patent

active

044995792

ABSTRACT:
The present invention relates to a dynamically testable programmable logic array in an unprogrammed state which adds some circuit components to the static test logic. The static test logic provides the capability to detect stuck-at faults at the input of each logic gate of the programmable logic array, and is inoperative during normal operation of the programmable logic array. The added circuit components cause selected inputs to the product array to partially enable the product array, whereby the remaining inputs to the product array are a function of the inputs to the programmable logic array, thereby providing the dynamic test capability.

REFERENCES:
patent: 3958110 (1976-05-01), Hong et al.
patent: 3961252 (1976-06-01), Eichelberger
patent: 4225957 (1980-09-01), Doty, Jr. et al.
patent: 4380811 (1983-04-01), Gotze et al.
patent: 4435805 (1984-03-01), Hsieh et al.
J. C. Logue et al., PLA Test Enhancement, IBM Technical Disclosure Bulletin, vol. 23, No. 3, Aug. 1980, pp. 1116-1117.

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