Programmable interconnect architecture employing leaky programma

Details Programmable interconnect architecture employing leaky programma Programmable interconnect architecture employing leaky programma

1992-07-24

1994-04-19

Hudspeth, David R.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307443, H03K 19177

Patent

active

053048717

ABSTRACT:
Apparatus for terminating unused input lines in a user-programmable interconnect architecture to one of a first voltage potential and a second voltage potential comprises at least one first tie-off conductor divided into at least two first segments and insulated from and intersecting the input lines, and at least one second tie-off conductor divided into at least two second segments and insulated from and intersecting the input lines. A plurality of first termination transistors each have their drains connected to a voltage rail for the first voltage potential and their sources connected to a different one of the first segments. A plurality of second termination transistors each have their sources connected to a voltage rail for the first voltage potential and their drains connected to a different one of the second segments. A termination transistor gate line is connected to the gates of each of the first and second termination transistors. A plurality of programming transistors each has its source connected to a different one of the first and second segments and its drain connected to a circuit which supplies a programming potential. A programming transistor gate line is connected to the gates of each of the programming transistors. Programming circuitry is connected to the programming transistor gate line, and is used to selectively turn on the gates of the programming transistors during a programming operation, and to selectively connect a programming voltage potential to the drain of a selected programming transistor while simultaneously connecting a potential substantially equal to one half of said programming voltage potential to the drains of all other programming transistors. Operation enable circuitry is connected to the first and second termination transistor gate line to connect the first and second segments to the first and second voltage potentials during circuit operation.

REFERENCES:
patent: 4706216 (1987-11-01), Carter
patent: 4758745 (1988-07-01), El Gamal et al.
patent: 5132571 (1992-07-01), McCollum et al.
patent: 5144166 (1992-09-01), Camarota et al.
patent: 5172014 (1992-12-01), El-Ayat et al.
patent: 5191241 (1993-03-01), McCollum et al.
patent: 5194759 (1993-03-01), El-Ayat et al.

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