Programmable integrated circuit fault detection apparatus

Details Programmable integrated circuit fault detection apparatus Programmable integrated circuit fault detection apparatus

1985-12-19

1987-10-27

Atkinson, Charles E.

Excavating

324 73R, 371 15, G01R 3128

Patent

active

047034840

ABSTRACT:
An integrated circuit fault detection system. The integrated circuit fault detection system includes gate means associated with each functional input and functional output of the chip. The gate means are connected between the functional input and functional output terminals and the bonding pad and are controllable to allow the chip to operate in normal fashion using the input and output terminals thereof and the bonding pads associated therewith. The gate means are also controllable to read test data into a functional input terminal of the chip, write test data out of the functional output terminal of the chip, drive test data from chip functional circuitry through the bonding pad off chip, and accept test data from the outside world through a bonding pad and transfer the test data to chip functional circuitry. The test results can then be analyzed to determine if the chip is functioning properly.

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