Programmable image computer

Details Programmable image computer Programmable image computer

2006-12-12

2006-12-12

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S122000, C702S185000

Reexamination Certificate

active

07149642

ABSTRACT:
An inspection system for detecting anomalies on a substrate. A first network is coupled to a sensor array and communicates data. Process nodes are coupled to the first network, and process the data to produce reports. Each process node has an interface card that formats the data for a high speed interface bus that is coupled to the interface card. A computer receives and processes the data to produce the report. A second network receives the reports. A job manager is coupled to the second network, receives the reports, and sends information to the process nodes to coordinate processing of the data.

REFERENCES:
patent: 4805123 (1989-02-01), Specht et al.
patent: 2004/0008867 (2004-01-01), Fein et al.
patent: 2005/0249395 (2005-11-01), Miller

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